Schafer, K. L.  A sensor and method for the in-situ monitoring and control of microstructure during rapid metal forming processes. U.S. patent #5,420,518, May 30, 1995.
 

SELECTED PAPERS AND MANUSCRIPTS

Kiefer, B.V., Keyzer, P.L., and Schafer, K.L.  In-line material characterization measurements in high-speed rod rolling mills.  International Symposium on Advanced Sensors for Metals Processing, Quebec City, Quebec, August 1999.

Schafer, K. L.  An on-line surface volume imaging system for ferritic microstructure and mechanical properties. Prepared for the Australasia-Pacific Forum on Intelligent Processing and Manufacturing of Materials, Brisbane, Australia, July 1997.

Schafer, K. L.  Genetic algorithms for optimizing and automating process control in critical- cycle continuous annealing. International Symposium on Recovery and Recrystallization in Steel Proceedings, I.S.S., 1996, 33, 611-613.

Schafer, K. L.  Presentation of MicroCert Research and Development Program to the American Iron and Steel Institute, Advanced Process Control Program, Project D, Online Mechanical Properties, I.M.I., Boucherville, Quebec, Oct. 10, 1996.

Schafer, K. L.  Radio-frequency electromagnetic imaging of ferritic microstructure in electrical lamination steels. A paper presented to the 37th Mechanical Working and Steel Processing Conference, I.S.S., Hamilton, Ontario, Oct. 25, 1995.

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